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Publications
  • 2023
  • Working Paper

Feature Importance Disparities for Data Bias Investigations

By: Peter W. Chang, Leor Fishman and Seth Neel
  • Format:Electronic
  • | Language:English
  • | Pages:29
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Abstract

It is widely held that one cause of downstream bias in classifiers is bias present in the training data. Rectifying such biases may involve context-dependent interventions such as training separate models on subgroups, removing features with bias in the collection process, or even conducting real-world experiments to ascertain sources of bias. Despite the need for such data bias investigations, few automated methods exist to assist practitioners in these efforts. In this paper, we present one such method that given a dataset X consisting of protected and unprotected features, outcomes y, and a regressor h that predicts y given X, outputs a tuple (fj,g), with the following property: g corresponds to a subset of the training dataset (X,y), such that the jth feature fj has much larger (or smaller) influence in the subgroup g, than on the dataset overall, which we call feature importance disparity (FID). We show across 4 datasets and 4 common feature importance methods of broad interest to the machine learning community that we can efficiently find subgroups with large FID values even over exponentially large subgroup classes and in practice these groups correspond to subgroups with potentially serious bias issues as measured by standard fairness metrics.

Keywords

AI and Machine Learning; Analytics and Data Science; Prejudice and Bias

Citation

Chang, Peter W., Leor Fishman, and Seth Neel. "Feature Importance Disparities for Data Bias Investigations." Working Paper, March 2023.
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About The Author

Seth Neel

Technology and Operations Management
→More Publications

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  • MoPe: Model Perturbation-based Privacy Attacks on Language Models By: Marvin Li, Jason Wang, Jeffrey Wang and Seth Neel
  • Black-box Training Data Identification in GANs via Detector Networks By: Lukman Olagoke, Salil Vadhan and Seth Neel
  • In-Context Unlearning: Language Models as Few Shot Unlearners By: Martin Pawelczyk, Seth Neel and Himabindu Lakkaraju
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