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Innovate Safely—CT Scanners and Radiation Risk

By: Hong Luo and Alberto Galasso
  • Format:Print
  • | Language:English
  • | Pages:12
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Abstract

Teaching Note for HBS No. 719-486.

Citation

Luo, Hong, and Alberto Galasso. "Innovate Safely—CT Scanners and Radiation Risk." Harvard Business School Teaching Note 720-398, October 2019.

About The Author

Hong Luo

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